Kawasaki, Japan

Haruo Ito

This inventor holds 1 USPTO granted patent. Top assignee: Fuji Electric Co., Ltd.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haruo Ito. Retrieved from https://idiyas.com/inventor/haruo-ito-2jwcopi3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Haruo Ito: Inventor in Detection Technology.

Introduction

Haruo Ito is an inventor associated with Kawasaki, Japan, and Fuji Electric Co., Ltd. His patent describes a method for detecting the flocculation process in a sample flow containing components with different spectral characteristics.

Latest Patents

The provided information lists one patent for Ito: “Method and Apparatus for Detecting Flocculation Process of Components in a Sample Flow.” The method irradiates the sample with a beam containing two or more wavelengths, measures the transmitted light with a photoelectric conversion device, and obtains electrical signals corresponding to the wavelengths. It then calculates the correlation coefficient between the signals to detect changes in flocculation over time. This approach is designed to make monitoring the process quick and straightforward.

Career Highlights

Ito’s listed patent reflects work on optical measurement and signal analysis for monitoring flocculation. The supplied information associates him with Fuji Electric Co., Ltd., and records 1 patent.

Collaborations

Yoshihiko Matsui and Norihito Tambo are identified as Ito’s coworkers. The available details do not specify their roles in the patent or the extent of their collaboration.

Conclusion

Haruo Ito’s recorded invention applies multiwavelength optical measurements and signal correlation to detect flocculation in a sample flow, highlighting a practical approach to process monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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