Toyama, Japan

Haruiki Obara

This inventor holds 1 USPTO granted patent. Top assignee: Fanuc Corporation. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haruiki Obara. Retrieved from https://idiyas.com/inventor/haruiki-obara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Haruiki Obara: Innovator in Wire Tension Control

Introduction

Haruiki Obara is a notable inventor based in Toyama, Japan. He has made significant contributions to the field of technology, particularly in the area of wire tension control. His innovative approach has led to the development of a unique patent that addresses critical challenges in this domain.

Latest Patents

Haruiki Obara holds a patent for an "Apparatus for wire tension control and disconnection detection." This invention is designed to enhance the efficiency and reliability of wire management systems. It showcases his commitment to advancing technology and improving operational processes.

Career Highlights

Obara is currently employed at Fanuc Corporation, a leading company in automation and robotics. His role at Fanuc allows him to apply his inventive skills in a practical setting, contributing to the company's reputation for innovation and excellence in the industry.

Collaborations

One of his notable coworkers is Syunzo Izumiya, with whom he collaborates on various projects. Their combined expertise fosters a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Haruiki Obara's contributions to wire tension control technology exemplify the spirit of innovation. His patent and work at Fanuc Corporation highlight his dedication to advancing the field. Through his efforts, he continues to inspire future generations of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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