Tokyo, Japan

Haruhiko Kikawa

This inventor holds 2 USPTO granted patents. Top assignee: Hitachi, Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haruhiko Kikawa. Retrieved from https://idiyas.com/inventor/haruhiko-kikawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2004

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2 patents (USPTO):Explore Patents

Title: Haruhiko Kikawa: Innovator in Liquid-Crystal Technology

Introduction

Haruhiko Kikawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of liquid-crystal technology, holding a total of 2 patents. His work has been instrumental in advancing the capabilities of liquid-crystal displays, which are widely used in various electronic devices.

Latest Patents

Kikawa's latest patents include innovations related to materials for liquid-crystal alignment films and liquid-crystal display elements. These patents focus on the processes for their production and the development of liquid-crystal display units. His work in this area has paved the way for improved display technologies.

Career Highlights

Haruhiko Kikawa is associated with Hitachi, Ltd., a leading company in technology and electronics. His role at Hitachi has allowed him to collaborate with other experts in the field and contribute to groundbreaking advancements in liquid-crystal technology.

Collaborations

Kikawa has worked alongside notable colleagues such as Nobuhito Katsumura and Takashi Inoue. Their combined expertise has fostered innovation and development in liquid-crystal technologies.

Conclusion

Haruhiko Kikawa's contributions to liquid-crystal technology through his patents and collaborations highlight his importance in the field. His work continues to influence the development of advanced display technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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