Company Filing History:
2 out of 7,642 
1 out of 12,883 
Years Active: 2004-2014
Title: The Innovations of Harry R Fair
Introduction
Harry R Fair is a notable inventor based in Arlington, MA (US). He has made significant contributions to the field of technology, particularly in the areas of fault tolerance and information processing. With a total of 3 patents to his name, Fair's work has had a lasting impact on the industry.
Latest Patents
One of his latest patents is the "Fault Tolerant Scannable Glitch Latch." This invention is designed for use with scan chains, enabling reset, debug, and repairability of machines and parts. The patent describes a scan shift enable signal that controls a switch, preventing a stuck-at zero fault on a data input line from affecting the state node during a scan chain operation. This innovation effectively eliminates the propagation of such faults.
Another significant patent is the "Partial Address Compares Stored in Translation Lookaside Buffer." This method allows for a fast information compare within a processor. It involves performing a more significant bit compare when information is loaded into a translation lookaside buffer. The results of this compare are stored as part of the entry containing the information, facilitating efficient matching with less significant bits.
Career Highlights
Throughout his career, Harry R Fair has worked with prominent companies such as Sun Microsystems, Inc. and Advanced Micro Devices Corporation. His experience in these organizations has contributed to his expertise and innovative capabilities in the field.
Collaborations
Fair has collaborated with notable individuals in the industry, including Matthew E Becker and Marc E Lamere. These partnerships have likely fostered an environment of creativity and innovation, leading to the development of his patents.
Conclusion
Harry R Fair's contributions to technology through his patents demonstrate his innovative spirit and expertise. His work continues to influence the field, showcasing the importance of advancements in fault tolerance and information processing.