The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2014
Filed:
Dec. 22, 2010
Kevin M. Gillespie, Pembroke, MA (US);
Joseph R. Siegel, Brookline, MA (US);
Dwight K. Elvey, Santa Cruz, CA (US);
Harry R. Fair, Arlington, MA (US);
Kevin M. Gillespie, Pembroke, MA (US);
Joseph R. Siegel, Brookline, MA (US);
Dwight K. Elvey, Santa Cruz, CA (US);
Harry R. Fair, Arlington, MA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A fault tolerant scannable glitch latch for use with scan chains that enable reset, debug and repairability of machines and parts is described. A scan shift enable signal controls a switch such that a stuck-at zero fault on a data input line is prevented from driving voltage to a state node or pulling the state node high during a scan chain operation. Propagation of the stuck-at zero fault is therefore eliminated. The scan shift enable signal also controls a switch that enables a parallel path to ground for the scan data and state node which would otherwise have been driven high due to the stuck-at zero fault.