Davidsonville, MD, United States of America

Harlan Ray, Iii

This inventor holds 1 USPTO granted patent. Top assignee: Johns Hopkins University. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Harlan Ray, Iii. Retrieved from https://idiyas.com/inventor/harlan-ray-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Harlan Ray, III: Inventor of a Telemetry Data Acquisition System.

Introduction

Harlan Ray, III, is an inventor based in Davidsonville, Maryland. His work includes a patented system for acquiring and handling telemetry data.

Latest Patents

Ray is credited with 1 patent: “Dual Autonomous Telemetry Data Acquisition System and Real Time Opto-Isolated Receivers for Use Therewith.” The invention describes a serial digital data acquisition receiver, or system of receivers, with an opto-isolator assembly, sampling logic, and a USB interface. The opto-isolator assembly receives both clock and data signals, while the sampling logic uses changes in the clock signal to determine when to sample the data. The USB interface provides telemetry data for processing, display, or recording and can also power the receiver from the connected output terminal.

Career Highlights

Ray is associated with Johns Hopkins University. His patented work focuses on telemetry data acquisition and the reliable handling of digital signals.

Collaborations

Ray’s listed coworker is Leo R. Gauthier, Jr. The available information identifies their professional association but does not specify further details about their collaboration.

Conclusion

Harlan Ray, III, is associated with a patented telemetry system that combines opto-isolated signal reception, clock-based sampling, and USB connectivity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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