South Bend, IN, United States of America

Haoran Geng

This inventor holds 1 USPTO granted patent. Top assignee: University of Notre Dame Du Lac. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haoran Geng. Retrieved from https://idiyas.com/inventor/haoran-geng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Haoran Geng: Innovator in Secure Data Processing

Introduction

Haoran Geng is an accomplished inventor based in South Bend, IN (US). He has made significant contributions to the field of secure data processing through his innovative patent. His work focuses on enhancing the security and efficiency of data operations.

Latest Patents

Haoran Geng holds a patent for "Circuits and systems for programmable in-memory encryption/decryption fabric including RA/CAM arrays for parallel processing of operations." This secure system is designed to perform operations on data using a plurality of look-up-table fabric modules. These modules are operatively coupled to an input state matrix, allowing for efficient encryption and decryption of data.

Career Highlights

Geng is affiliated with the University of Notre Dame Du Lac, where he continues to advance his research in secure systems. His innovative approach to data processing has garnered attention in the academic and technological communities.

Collaborations

Some of his notable coworkers include Xiaobo Sharon Hu and Dayane Alfenas Reis. Their collaborative efforts contribute to the ongoing research and development in the field of secure data processing.

Conclusion

Haoran Geng's contributions to secure data processing through his innovative patent highlight his role as a leading inventor in this critical area. His work continues to influence advancements in technology and security.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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