West Lebanon, NH, United States of America

Haoning Fu

This inventor holds 2 USPTO granted patents. Top assignee: M2s, Inc.. Active years: 2008-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haoning Fu. Retrieved from https://idiyas.com/inventor/haoning-fu-ty64o2fz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2008-2009

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2 patents (USPTO):Explore Patents

Title: Haoning Fu: Innovator in Medical Imaging Technology

Introduction

Haoning Fu is a notable inventor based in West Lebanon, NH (US), recognized for his contributions to medical imaging technology. With a total of 2 patents to his name, he has made significant strides in the field, particularly in the area of statistical process control.

Latest Patents

Haoning Fu's latest patents include innovative methods that utilize statistical process control (SPC) to demonstrate solution convergence in a technician-guided segmentation system. This method and apparatus are designed for generating a computer model from scan data obtained from patients, showcasing his commitment to enhancing medical imaging processes.

Career Highlights

Fu is currently employed at M2S, Inc., where he applies his expertise in developing advanced imaging solutions. His work has been instrumental in improving the accuracy and efficiency of medical imaging technologies.

Collaborations

Throughout his career, Haoning Fu has collaborated with talented professionals, including David Chen and M Weston Chapman. These partnerships have contributed to the successful development of his innovative projects.

Conclusion

Haoning Fu's work in medical imaging technology exemplifies the impact of innovation in healthcare. His patents and collaborations highlight his dedication to advancing the field and improving patient outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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