Shenzhen, China

Haobo He

This inventor holds 3 USPTO granted patents. Top assignee: Oracle International Corporation. Active years: 2017-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haobo He. Retrieved from https://idiyas.com/inventor/haobo-he

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.5

ph-index = 2

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2017-2021

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3 patents (USPTO):Explore Patents

Title: Haobo He: Innovator in Log Analytics Systems

Introduction

Haobo He is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of log analytics, holding a total of 3 patents. His work focuses on improving the efficiency of log record collection and analysis.

Latest Patents

Haobo He’s latest patents include a method and system for implementing collection-wise processing in a log analytics system. This innovation provides a system, method, and computer program product that can configure, collect, and analyze log records efficiently. Another notable patent is for implementing an operating system hook in a log analytics system. This approach enhances the identification of log files that have undergone status changes, allowing for timely retrieval of log data.

Career Highlights

Haobo He is currently employed at Oracle International Corporation, where he continues to develop innovative solutions in log analytics. His expertise in this area has positioned him as a valuable asset to his team and the company.

Collaborations

Some of his coworkers include Jerry Paul Russell and Greg Ma, who collaborate with him on various projects within the company.

Conclusion

Haobo He is a dedicated inventor whose work in log analytics has led to significant advancements in the field. His contributions are shaping the future of log data management and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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