Suwon, South Korea

Hansung Leem

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hansung Leem. Retrieved from https://idiyas.com/inventor/hansung-leem-28rnq3a7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hansung Leem: Inventor of Geomagnetic Sensor Calibration Technology.

Introduction

Hansung Leem is an inventor based in Suwon, South Korea. His patent work includes an electronic device and operating method designed to calibrate a geomagnetic sensor using information about the user’s motion.

Latest Patents

Leem is associated with 1 patent: “Electronic Device for Calibrating Geomagnetic Sensor, and Method of Operating Electronic Device.” The invention describes an electronic device containing a geomagnetic sensor, a motion sensor, and a processor. The processor determines whether calibration is needed, identifies the user’s motion from motion-sensor data, and selects a range of geomagnetic data for calibration based on that motion. It then calibrates the sensor using the selected data.

Career Highlights

Leem’s listed patent is associated with Samsung Electronics Ltd. The invention reflects work on sensor calibration methods that use motion data to guide the selection of measurements.

Collaborations

The provided information lists Junyoung Woo and Taeyoon Kim as Leem’s coworkers. Their specific roles in the patent or related work are not specified.

Conclusion

Hansung Leem’s patent describes a motion-informed approach to geomagnetic sensor calibration, connecting sensor measurements with the user’s movement to determine which data to use.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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