This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Aixacct Systems Gmbh, Rwth Aachen. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2016
Title: Innovations of Hans-Peter Bauer
Introduction
Hans-Peter Bauer is an accomplished inventor based in Eynatten, Belgium. He has made significant contributions to the field of charge carrier beam technology. His innovative approach has led to the development of a unique method for determining beam parameters, which has practical applications in various scientific and industrial settings.
Latest Patents
Hans-Peter Bauer holds a patent for a "Method for determining beam parameters of a charge carrier beam, measuring device, and charge carrier beam device." This patent describes a method that involves guiding a charge carrier beam through a slit aperture arrangement. The measurement plane coordinates of the beam components that penetrate the slit aperture are determined, allowing for precise measurement of beam parameters. The system is designed to automatically adjust the measuring aperture based on predefined reference points, enhancing measurement accuracy.
Career Highlights
Throughout his career, Hans-Peter Bauer has worked with notable companies such as Aixacct Systems GmbH and RWTH Aachen. His experience in these organizations has contributed to his expertise in beam technology and measurement systems. His work has been instrumental in advancing the understanding and application of charge carrier beams.
Collaborations
Hans-Peter Bauer has collaborated with esteemed colleagues, including Bernd Reichenberg and Sebastian Ufer. These partnerships have fostered innovation and have played a crucial role in the development of his patented technologies.
Conclusion
Hans-Peter Bauer's contributions to the field of charge carrier beam technology exemplify the spirit of innovation. His patented methods and devices continue to influence advancements in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile