Ingolstadt, Germany

Hans-Martin Kroll

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Ibeo Automotive Systems Gmbh. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hans-Martin Kroll. Retrieved from https://idiyas.com/inventor/hans-martin-kroll

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hans-Martin Kroll

Introduction

Hans-Martin Kroll is a notable inventor based in Ingolstadt, Germany. He has made significant contributions to the field of optical distance measurement. His innovative approach aims to enhance the reliability of measurement devices.

Latest Patents

Kroll holds a patent for a "Method and device for optically measuring distances." This invention proposes that measurement pulses are sent out aperiodically to improve the failure proneness of optical distance measurement methods and devices. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Kroll is currently employed at Ibeo Automotive Systems GmbH, where he applies his knowledge and skills to develop advanced automotive technologies. His work focuses on enhancing the precision and reliability of measurement systems in the automotive industry.

Collaborations

Throughout his career, Kroll has collaborated with talented professionals, including Michael Köhler and Michael Kiehn. These partnerships have contributed to the advancement of innovative solutions in their field.

Conclusion

Hans-Martin Kroll's contributions to optical distance measurement reflect his commitment to innovation and excellence. His work continues to influence the automotive industry and improve measurement technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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