Hanover, Germany

Hans-Jurgen Diekmann

This inventor holds 1 USPTO granted patent. Top assignee: Continental Aktiengesellschaft. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hans-Jurgen Diekmann. Retrieved from https://idiyas.com/inventor/hans-jurgen-diekmann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hans-Jurgen Diekmann

Introduction

Hans-Jurgen Diekmann is a notable inventor based in Hanover, Germany. He has made significant contributions to the field of measurement technology. His innovative approach has led to the development of a unique measuring arrangement that enhances the accuracy of distance detection between movable components.

Latest Patents

Diekmann holds a patent for a measuring arrangement designed for contactless detection of distance. This invention focuses on a system that utilizes a magnet to achieve a noise-free signal with minimal technical complexity. The arrangement includes a magnetic field sensor that is strategically positioned to detect changes in the magnetic field, which are then converted into a proportional electrical control signal.

Career Highlights

Diekmann is associated with Continental Aktiengesellschaft, a leading automotive manufacturing company. His work at Continental has allowed him to apply his innovative ideas in practical applications, contributing to advancements in automotive technology.

Collaborations

Diekmann has collaborated with Eckhard Schneider, enhancing the development of his inventions through teamwork and shared expertise.

Conclusion

Hans-Jurgen Diekmann's contributions to measurement technology exemplify the impact of innovative thinking in engineering. His patent for a contactless measuring arrangement showcases his ability to solve complex problems with elegant solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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