Hiddenhausen, Germany

Hans-Joachim Schrauwen

This inventor holds 1 USPTO granted patent. Top assignee: Aeg Aktiengesellschaft. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hans-Joachim Schrauwen. Retrieved from https://idiyas.com/inventor/hans-joachim-schrauwen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hans-Joachim Schrauwen

Introduction

Hans-Joachim Schrauwen is a notable inventor based in Hiddenhausen, Germany. He has made significant contributions to the field of material processing through his innovative ideas and patents. His work primarily focuses on methods that enhance the efficiency and accuracy of material handling.

Latest Patents

One of Hans-Joachim Schrauwen's key patents is titled "Method for the position detection of the strip edge of a material web." This patent addresses the challenges associated with accurately detecting the edges of material strips, which is crucial for various industrial applications. His innovative approach has the potential to improve production processes and reduce waste.

Career Highlights

Hans-Joachim Schrauwen is associated with AEG Aktiengesellschaft, a company known for its advancements in technology and engineering. His role at AEG has allowed him to apply his inventive skills in a practical setting, contributing to the company's reputation for innovation.

Conclusion

Hans-Joachim Schrauwen's work exemplifies the spirit of innovation in the field of material processing. His contributions, particularly through his patent, demonstrate his commitment to improving industrial practices. His career continues to inspire future inventors in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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