This inventor holds 3 USPTO granted patents. Top assignee: Siemens Aktiengesellschaft. Active years: 1999-2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1999-2000
Title: Hans-Gerd Mederer: Patents in Industrial Process Analysis.
Introduction
Hans-Gerd Mederer is an inventor based in Erlangen, Germany, associated with Siemens Aktiengesellschaft. His work includes patented methods for analyzing process signals and data in industrial plants, particularly power station plants. His portfolio includes 3 patents.
Latest Patents
One of Mederer’s latest patents, “Method for Analyzing Process Signals of a Technical Plant, in Particular,” describes a way to assess process signals for diagnosing or forecasting a plant’s state. The method checks which functional units contain each signal, then measures correlations between signals based on the functional units they share. It presents correlated signals as information elements, with their relative distances representing the strength of their correlations.
Another patent, “Method for the Analysis of Process Data of an Industrial Plant,” addresses information compression, filtering, and timely fault diagnosis. It uses process features and relevant parameters to determine which features are present in different plant parts. The method then identifies correlations among plant parts and features and represents them as information elements, positioning them so that distances indicate the degree of correlation.
Career Highlights
Mederer’s patent work focuses on organizing and interpreting complex industrial process information. The described methods use relationships among signals, plant components, and process features to support analysis and diagnosis.
Collaborations
Mederer is associated with Siemens Aktiengesellschaft. His listed coworkers include Jiri Panyr and Thorsten Fuhring.
Conclusion
Hans-Gerd Mederer’s patents describe approaches to analyzing industrial process signals and data by identifying and visualizing correlations, supporting more structured monitoring and diagnosis of technical plants.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
