Kronberg, Germany

Hans-Georg Flach

This inventor holds 1 USPTO granted patent. Top assignee: Vdo Adolf Schindling Ag. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hans-Georg Flach. Retrieved from https://idiyas.com/inventor/hans-georg-flach

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 1977

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Hans-Georg Flach

Introduction

Hans-Georg Flach is a notable inventor based in Kronberg, Germany. He has made significant contributions to the field of measurement technology. His innovative approach has led to the development of a unique patent that enhances the functionality of measuring systems.

Latest Patents

Flach holds a patent for a "Moving-coil measuring system with a large pointer deflection." This invention features a moving-coil measuring system that utilizes a pole ring with a projection, a pole plate with a projection, and a permanent magnet arranged between these projections. The design allows for a moving coil that embraces the pole ring, with the coil's shaft rotating in two bushings that are concentric with respect to the pole ring. One bushing is mounted in the pole plate, while the other is mounted in a support fastened to the pole plate. This innovative design allows for improved accuracy and efficiency in measurement.

Career Highlights

Flach is associated with VDO Adolf Schindling AG, where he has contributed his expertise in measurement technology. His work has been instrumental in advancing the capabilities of the company's products.

Collaborations

Flach has collaborated with Bernhard Stier, a fellow innovator in the field. Their partnership has fostered a creative environment that encourages the development of new technologies.

Conclusion

Hans-Georg Flach's contributions to measurement technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…