Taoyuan, Taiwan

Han-Xiang Li

This inventor holds 1 USPTO granted patent. Top assignee: National Central University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Han-Xiang Li. Retrieved from https://idiyas.com/inventor/han-xiang-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Han-Xiang Li: Inventor in Physical Property Measurement

Introduction

Han-Xiang Li is an inventor based in Taoyuan, Taiwan. His work includes a patented method that applies deep learning to estimate physical properties of a measured fluid from mass-flow data. The provided information lists National Central University as his company.

Latest Patents

Li is associated with 1 patent, titled “Method of Measuring Physical Properties.” The method generates simulated mass-flow data from training physical-property parameters and vessel-shape information, then uses those data to train a deep-learning model. During measurement, fluid enters a vessel through an opening, and a scale records the loader’s accumulated weight over time to derive measured mass-flow data. The model processes those data to estimate a set of physical properties for the fluid.

Career Highlights

The patent describes an approach that combines vessel geometry, weight measurements, and machine learning to infer fluid properties. National Central University is identified as Li’s organization in the information provided.

Collaborations

Chun-Hung Weng is identified as Li’s coworker. The provided information does not specify further details about their collaboration.

Conclusion

Han-Xiang Li’s listed patent presents a deep-learning method for estimating fluid properties from measured mass-flow data, connecting computational modeling with physical measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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