Chantilly, VA, United States of America

Han Wang

This inventor holds 1 USPTO granted patent. Top assignee: Microsoft Technology Licensing, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Han Wang. Retrieved from https://idiyas.com/inventor/han-wang-yznwxjpn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Han Wang

Introduction

Han Wang is an accomplished inventor based in Chantilly, VA (US). He has made significant contributions to the field of data processing through his innovative patent. His work focuses on enhancing user experiences by personalizing data interactions.

Latest Patents

Han Wang holds a patent for a system titled "Personalized data processing experience and canvas interfaces." This patent outlines systems and methods that facilitate the discovery and presentation of skills and data within blocks of a canvas displayed to users. The technology aims to provide personalized and contextually relevant experiences as users interact with the data and interfaces. He has 1 patent to his name.

Career Highlights

Han Wang is currently employed at Microsoft Technology Licensing, LLC, where he continues to develop innovative solutions that enhance user engagement and data interaction. His work at Microsoft has positioned him as a key player in the technology sector.

Collaborations

Han has collaborated with notable colleagues, including PalaniRaj Kaliyaperumal and Kuralmani Elango. These collaborations have contributed to the advancement of his projects and the overall innovation landscape.

Conclusion

Han Wang's contributions to personalized data processing exemplify the impact of innovation in technology. His work not only enhances user experiences but also sets a foundation for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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