Yongin, South Korea

Han-Sik Kim

This inventor holds 1 USPTO granted patent. Top assignee: Hl Klemove Corp.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Han-Sik Kim. Retrieved from https://idiyas.com/inventor/han-sik-kim-p7c3gg1m

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Han-Sik Kim: Innovator in Process Inspection Technology

Introduction

Han-Sik Kim is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of process inspection technology. His innovative work has led to the development of a unique device and method that enhances the efficiency of electronic control systems.

Latest Patents

Han-Sik Kim holds a patent for a "Device and method for inspecting process, and electronic control device." This invention relates to a device that includes a converting controller and an inspecting controller. The converting controller is designed to generate process monitoring messages based on specific values inputted into a designated area during serial communication. The inspecting controller then utilizes these messages to monitor processes effectively.

Career Highlights

Han-Sik Kim is currently associated with Hl Klemove Corp., where he continues to innovate and develop advanced technologies. His work has been instrumental in improving process inspection methods, making them more reliable and efficient.

Collaborations

Some of his notable coworkers include Jong Gyu Park and Seung Gap Choi. Their collaborative efforts contribute to the advancement of technology within their organization.

Conclusion

Han-Sik Kim's contributions to process inspection technology exemplify his dedication to innovation. His patent and ongoing work at Hl Klemove Corp. highlight his role as a key figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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