Nashville, TN, United States of America

Han Liu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Siemens Healthineers Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Han Liu. Retrieved from https://idiyas.com/inventor/han-liu-k5eqksnv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Han Liu: Advancing Medical Imaging Analysis Through Machine Learning.

Introduction

Han Liu is an inventor based in Nashville, Tennessee, whose patent work focuses on machine learning methods for medical imaging analysis. His invention addresses how models can learn to identify anatomical objects when training datasets have only partial labels.

Latest Patents

Liu is associated with 1 patent: “Learning from Partially Labeled Datasets for Medical Imaging Analysis.” The patent describes systems and methods that receive medical images, perform an analysis task using a machine-learning model, and output the results. The model is trained using medical images and available ground-truth labels, then generates pseudo labels for anatomical objects in those images. It is subsequently fine-tuned using both the original labels and the generated pseudo labels.

Career Highlights

Liu works at Siemens Healthineers AG, a company focused on healthcare technology. His patent reflects an approach to making use of partially labeled medical imaging data in the development of machine-learning models.

Collaborations

Liu’s listed coworker is Sasa Grbic. The patent information provided describes the invention but does not specify the individual contributions of its collaborators.

Conclusion

Han Liu’s patent presents a machine-learning approach that combines ground-truth and pseudo labels to support medical imaging analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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