This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Han-Awl Lee: Innovator in Automated Testing Technology
Introduction
Han-Awl Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of automated testing technology, particularly in the area of electrostatic discharge testing.
Latest Patents
Han-Awl Lee holds a patent for an "Apparatus and method for automated testing of device under test." This innovative apparatus and method provide a solution for automated testing of electrostatic discharge of a Device Under Test (DUT). The process involves applying an electrostatic pulse to the DUT, detecting any malfunction type from the DUT, and transmitting a control command to return the DUT to a normal mode based on the detected malfunction type. He has 1 patent to his name.
Career Highlights
Han-Awl Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to develop cutting-edge technologies. His work has been instrumental in enhancing the reliability and efficiency of electronic devices.
Collaborations
He has collaborated with notable colleagues, including Jae-Kyu Lee and Woong-Hae Choi, contributing to various projects that push the boundaries of technology.
Conclusion
Han-Awl Lee's innovative work in automated testing technology exemplifies the impact of dedicated inventors in advancing electronic device testing methods. His contributions are vital to the ongoing evolution of technology in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile