Garland, TX, United States of America

Hal Edwards


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 45(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Hal Edwards - Innovator in Scanning-Probe Microscopy

Introduction

Hal Edwards is a notable inventor based in Garland, Texas. He has made significant contributions to the field of microscopy, particularly through his innovative patent related to scanning-probe technology. His work has implications for various scientific and industrial applications.

Latest Patents

Hal Edwards holds a patent for a scanning-probe microscope that includes non-optical means for detecting. This invention features an XYZ piezo drive, a quartz tuning-fork oscillator, and a probe tip designed to measure the topography of a sample's surface. The unique design allows for precise interaction between the probe tip and the sample surface, enabling accurate measurements and monitoring of electrical impedance.

Career Highlights

Hal Edwards is associated with Texas Instruments Corporation, where he has applied his expertise in developing advanced technological solutions. His work at the company has contributed to the advancement of measurement techniques in various scientific fields.

Collaborations

Hal Edwards has collaborated with Walter Marvin Duncan, enhancing the innovative capabilities within their projects. Their partnership has fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Hal Edwards is a distinguished inventor whose work in scanning-probe microscopy exemplifies innovation in measurement technology. His contributions continue to influence the scientific community and advance the field of microscopy.

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