Kanagawa, Japan

Hajime Nakagawa

This inventor holds 18 USPTO granted patents, primarily in Photothermographic Materials. Top assignees: Fuji Photo Film Company, Limited, Fujifilm Corporation. Active years: 1991-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hajime Nakagawa. Retrieved from https://idiyas.com/inventor/hajime-nakagawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 14(Granted Patents)


Location History:

  • Ashigara, JP (2004)
  • Minami-ashigara, JP (1991 - 2007)
  • Kanagawa, JP (1995 - 2008)

Company Filing History:


Years Active: 1991-2008

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Areas of Expertise:
Photothermographic Material
Image Recording
Heat Developable
Color Photographic
Silver Halide
Thermal Processing
Aqueous Coating
Light-Sensitive Material
Image Forming Method
Photothermographic Image
Heat Development
18 patents (USPTO):Explore Patents

Title: Inventor Hajime Nakagawa

Introduction: Hajime Nakagawa is a renowned inventor based in Kanagawa, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Hajime Nakagawa holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With over two decades of experience in the industry, Nakagawa has worked for leading tech companies, where he spearheaded research and development projects that have led to significant advancements in the field.

Collaborations: Throughout his career, Hajime Nakagawa has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and knowledge sharing.

Conclusion: Hajime Nakagawa's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and researchers in Japan and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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