Madison, WI, United States of America

Hairong Shi

This inventor holds 1 USPTO granted patent. Top assignee: Wisconsin Alumni Research Foundation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hairong Shi. Retrieved from https://idiyas.com/inventor/hairong-shi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Hairong Shi: Innovator in High-Resolution Elastography

Introduction

Hairong Shi is a prominent inventor based in Madison, WI (US). She has made significant contributions to the field of elastography, particularly through her innovative patent. Her work focuses on enhancing the accuracy of displacement measurements, which is crucial for various medical applications.

Latest Patents

Hairong Shi holds a patent titled "High resolution elastography using two step strain estimation." This patent describes a multiple-step process that utilizes successively finer samplings of data and smaller areas of evaluation. The method aims to provide increasingly accurate displacement measurements, where each measurement informs the next evaluation, leading to improved diagnostic capabilities.

Career Highlights

Hairong Shi is affiliated with the Wisconsin Alumni Research Foundation, where she continues to advance her research and innovations. Her dedication to her work has positioned her as a key figure in the development of high-resolution elastography techniques.

Collaborations

She collaborates with esteemed colleagues, including Tomy Varghese and Hao Chen, who contribute to her research endeavors and help drive innovation in the field.

Conclusion

Hairong Shi's contributions to high-resolution elastography exemplify her commitment to advancing medical technology. Her innovative approaches and collaborative spirit continue to inspire progress in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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