Wuhan, China

Haiming Cao

This inventor holds 1 USPTO granted patent. Top assignee: Wuhan China Star Optoelectronics Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haiming Cao. Retrieved from https://idiyas.com/inventor/haiming-cao-7qbrmqaw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Haiming Cao and Display Technology Innovation.

Introduction

Haiming Cao is an inventor associated with Wuhan, China, and Wuhan China Star Optoelectronics Technology Co., Ltd. His patent work concerns display technology, including components used in display panels and devices.

Latest Patents

Cao is credited with 1 patent: “Array Substrate, Display Panel and Display Device.” The invention describes an array substrate with a base, a buffer layer, and a thin-film transistor. The buffer layer has first and second layers, with the first positioned between the base and the second layer. Its refractive index is greater than those of the base and second buffer layer, while its ratio to the base’s refractive index is no more than 1.25. The thin-film transistor is positioned above the buffer layer, away from the base.

Career Highlights

Cao’s listed patent reflects work on the structure of display components and the optical properties of layers within an array substrate. His professional association with Wuhan China Star Optoelectronics Technology Co., Ltd. connects his invention to the display technology sector.

Collaborations

Cao’s listed coworkers include Chao Tian and Shiyu Long. Their shared association provides context for the professional network surrounding his patent work.

Conclusion

Haiming Cao’s patent focuses on a layered array-substrate design for display panels and devices, highlighting his contribution to display technology innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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