Xiamen, China

Hailong Wang

This inventor holds 1 USPTO granted patent. Top assignee: Xiamen University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hailong Wang. Retrieved from https://idiyas.com/inventor/hailong-wang-2xhesay7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hailong Wang: Innovator in Optical Systems

Introduction

Hailong Wang is a prominent inventor based in Xiamen, China. He has made significant contributions to the field of optical testing, particularly through his innovative designs and patents. His work focuses on optimizing the structure of objective lenses and enhancing optical imaging devices.

Latest Patents

Hailong Wang holds a patent for an objective lens, an optical imaging device, an optical system, and a test method of the optical system. This invention relates to the field of optical testing and aims to improve the functionality of optical systems. The objective lens comprises a housing with a cavity that features a first opening and a second opening. The optical focusing assembly is mounted within this cavity, with its focal point located at the second opening. The assembly is designed to focus light entering the housing from the first opening to the focal point, utilizing either the reflection principle or the refraction principle.

Career Highlights

Hailong Wang is affiliated with Xiamen University, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in various optical devices.

Collaborations

Hailong Wang has collaborated with notable colleagues, including Songyuan Ding and Binbin Zhang, contributing to the advancement of optical research and development.

Conclusion

Hailong Wang's innovative work in optical systems exemplifies the importance of research and development in enhancing technology. His contributions continue to influence the field of optical testing and imaging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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