Jiangsu, China

Hai Thien Nguyen

This inventor holds 1 USPTO granted patent. Top assignee: Patsnap Limited. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hai Thien Nguyen. Retrieved from https://idiyas.com/inventor/hai-thien-nguyen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Hai Thien Nguyen

Introduction

Hai Thien Nguyen is a notable inventor based in Jiangsu, China. He has made significant contributions to the field of image database technology. His innovative approach addresses common challenges in database establishment, enhancing efficiency and effectiveness.

Latest Patents

Hai Thien Nguyen holds a patent for an "Image database establishing method, searching method, electronic device, and storage medium." This method involves obtaining a target file with target text information, generating a corresponding target image, and storing it to form an image database. This innovative method resolves the time-consuming and labor-intensive process of manually filtering and analyzing massive text files, thereby improving the efficiency of establishing an image database. He has 1 patent to his name.

Career Highlights

Currently, Hai Thien Nguyen is employed at Patsnap Limited, where he continues to develop and refine his innovative ideas. His work focuses on enhancing the capabilities of image databases and related technologies.

Collaborations

He collaborates with talented individuals such as Pankaj Kumar and Markus Haense, contributing to a dynamic and innovative work environment.

Conclusion

Hai Thien Nguyen's contributions to image database technology exemplify the impact of innovation in improving efficiency in data management. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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