Panorama City, CA, United States of America

Hai Jiang


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2014

Loading Chart...
1 patent (USPTO):

Title: Innovations by Inventor Hai Jiang

Introduction

Hai Jiang is an accomplished inventor based in Panorama City, California. He has made significant contributions to the field of defect detection through his innovative patent. His work focuses on enhancing the accuracy and efficiency of inspection processes in various applications.

Latest Patents

One of Hai Jiang's notable patents is titled "Contour-based defect detection using an inspection apparatus." This patent describes a method for inspecting a site location on a target substrate. The process involves obtaining contours generated from a reference image using a design clip. A target image of the site location is then acquired, and the contours are aligned to this target image. Contrast values are computed for pixels on the contours, and a threshold is applied to these values to determine contour-based defect blobs. The patent also includes methods for generating contours for defect inspection, showcasing Jiang's innovative approach to improving inspection technology.

Career Highlights

Hai Jiang is associated with Kla Tencor Corporation, a company known for its advanced technology in the semiconductor industry. His work at Kla Tencor has allowed him to apply his inventive skills to real-world challenges, contributing to the company's reputation for excellence in defect detection and inspection solutions.

Collaborations

Throughout his career, Hai Jiang has collaborated with talented professionals, including Chien-Huei Adam Chen and Peter Francis White. These collaborations have likely enriched his work and contributed to the development of innovative solutions in the field.

Conclusion

Hai Jiang's contributions to defect detection technology through his patent demonstrate his commitment to innovation. His work at Kla Tencor Corporation and collaborations with other professionals highlight his role in advancing inspection methodologies. His achievements reflect the importance of innovation in enhancing technology and improving industry standards.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…