Daejeon, South Korea

Haemin Lee

This inventor holds 1 USPTO granted patent. Top assignee: Agency for Defense Development. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haemin Lee. Retrieved from https://idiyas.com/inventor/haemin-lee-9w4wdxeq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Haemin Lee and SAR Jamming Signal Generation.

Introduction

Haemin Lee is an inventor based in Daejeon, South Korea. His patent work includes a method and system for generating synthetic aperture radar (SAR) jamming signals. Lee is associated with the Agency for Defense Development.

Latest Patents

Lee is listed as an inventor on 1 patent: “Jamming Signal Generation Method and System.” The invention describes receiving an SAR transmission signal and determining the form and position of a noise patch in a predefined coordinate system. It then transforms that information into the SAR image formation plane coordinate system and uses the transformed noise patch to create reflectivity map models. A two-dimensional fast Fourier transform is applied to the first model, and the resulting model is combined with a reference signal through convolution to generate an SAR jamming signal.

Career Highlights

Lee’s documented patent contribution concerns signal generation for SAR jamming. The described method connects coordinate transformation, reflectivity modeling, and signal processing to produce the jamming signal.

Collaborations

Lee’s listed coworker is Kiwan Kim. The provided information does not specify their respective roles or the details of their collaboration.

Conclusion

Haemin Lee’s patent documents a technical approach to generating SAR jamming signals through coordinate transformation and reflectivity-map processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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