Durham, NC, United States of America

Haechul Shin

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: International Business Machines Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haechul Shin. Retrieved from https://idiyas.com/inventor/haechul-shin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Haechul Shin: Innovator in Crowd-sourced Quality Assurance

Introduction

Haechul Shin is a notable inventor based in Durham, NC (US). He has made significant contributions to the field of quality assurance through his innovative approaches. His work focuses on enhancing the reliability of distributed testing systems.

Latest Patents

Haechul Shin holds 1 patent for his invention titled "Crowd-sourced QA with trusted compute model." This patent presents a method for collecting distributed test results from multiple users, including untrusted users. The approach aggregates these results to ensure that they correspond to the same system under test, ultimately presenting the aggregated results as a trusted test result.

Career Highlights

Haechul Shin is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technologies and contribute to advancements in quality assurance methodologies.

Collaborations

Some of his notable coworkers include Shelley Lambert and Timothy P Ellison. Their collaboration fosters an environment of innovation and shared expertise within the company.

Conclusion

Haechul Shin's contributions to crowd-sourced quality assurance exemplify the impact of innovative thinking in technology. His work continues to influence the field and enhance the reliability of testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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