Seoul, South Korea

Hae Joon Kim

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Lunit Inc.. Active years: 2025.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hae Joon Kim: Innovator in Medical Imaging Technology

Introduction

Hae Joon Kim is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of medical imaging technology. His innovative work focuses on enhancing the accuracy and efficiency of medical image processing.

Latest Patents

Hae Joon Kim holds a patent for a medical imaging device and a medical image processing method. This patent describes a method for operating a medical imaging device that includes obtaining lesion information on at least one lesion detected from a medical image. The method further involves determining the shape and position of at least one contour corresponding to the detected lesion based on the obtained lesion information. Additionally, it determines the position of at least one text region that includes text indicating the lesion information. Finally, the method displays the contour and the text on the medical image, based on the determined shape and position.

Career Highlights

Hae Joon Kim is currently associated with Lunit Inc., a company known for its advancements in medical AI technology. His work at Lunit Inc. has positioned him as a key player in the development of innovative medical imaging solutions.

Collaborations

Hae Joon Kim collaborates with talented individuals such as Dong Geun Yoo and Min Chul Kim. Their combined expertise contributes to the ongoing success of their projects in medical imaging.

Conclusion

Hae Joon Kim's contributions to medical imaging technology exemplify the impact of innovation in healthcare. His patent and work at Lunit Inc. highlight the importance of advancements in medical image processing.

Profile summary based on public USPTO records.
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