Seongnam, South Korea

Haan Joon Lee

This inventor holds 1 USPTO granted patent. Top assignee: Hanwha Vision Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haan Joon Lee. Retrieved from https://idiyas.com/inventor/haan-joon-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Haan Joon Lee: Innovator in Surveillance Technology

Introduction

Haan Joon Lee is a notable inventor based in Seongnam, South Korea. He has made significant contributions to the field of surveillance technology. His innovative approach focuses on enhancing security device installation solutions.

Latest Patents

Haan Joon Lee holds a patent for a "Surveillance planning device and method for providing security device installation solution using same." This invention provides a surveillance planning device that generates a checklist based on spatial and object information of a region. It also obtains device installation condition information from user responses to the checklist. The device then recommends a list of devices to be installed and their optimal installation locations based on the gathered information. He has 1 patent to his name.

Career Highlights

Haan Joon Lee is currently employed at Hanwha Vision Co., Ltd. His work at the company emphasizes the integration of advanced technology in security solutions. His innovative contributions have positioned him as a key figure in the development of surveillance systems.

Collaborations

Haan Joon Lee collaborates with talented individuals such as Sang Yun Lee and Dong Won Kim. Their teamwork fosters a creative environment that drives innovation in their projects.

Conclusion

Haan Joon Lee's work in surveillance technology exemplifies the impact of innovation on security solutions. His contributions continue to shape the future of surveillance systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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