Yongin, South Korea

Ha Yeong Nam

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ha Yeong Nam. Retrieved from https://idiyas.com/inventor/ha-yeong-nam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ha Yeong Nam: Inventor of Display Input-Sensing Technology.

Introduction

Ha Yeong Nam is an inventor associated with Yongin, South Korea, and Samsung Display Co., Ltd. The available information identifies 1 patent associated with Nam.

Latest Patents

Nam’s listed patent is “Input Sensing Part and Display Device Including the Same.” It describes an input-sensing component with a base layer divided into active and peripheral areas. First and second sensing electrodes extend in intersecting directions within the active area. Separate, insulated pen-sensing electrodes extend in those same respective directions. A pen-sensing line connects to the first pen-sensing electrodes, while an additional electrode is insulated from the line and overlaps at least part of it when viewed in plan.

Career Highlights

Nam’s listed patent concerns display input sensing and pen detection, including the arrangement of sensing electrodes and an overlapping additional electrode. The provided information associates this work with Samsung Display Co., Ltd.

Collaborations

Ye Ri Jeong and Jeong Yun Han are identified as Nam’s coworkers. The available information does not specify their roles or particular contributions to the patent.

Conclusion

Ha Yeong Nam’s listed invention addresses electrode and signal-line arrangements for input and pen sensing in a display device, reflecting work associated with Samsung Display Co., Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…