Liverpool, NY, United States of America

H T Meyer

This inventor holds 1 USPTO granted patent. Top assignee: General Staple Company, Inc.. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: H T Meyer. Retrieved from https://idiyas.com/inventor/h-t-meyer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: H T Meyer: Innovator of the Autotab Machine

Introduction

H T Meyer is a notable inventor based in Liverpool, NY (US), recognized for his innovative contributions to the field of automation. He holds a patent for a unique apparatus designed to enhance the efficiency of terminal insertion in workpieces.

Latest Patents

Meyer’s most recent patent is for the Autotab machine. This invention discloses an apparatus, method, and supply strip for inserting terminals into an apertured workpiece. The Autotab machine features feeding means that sequentially advance a supply strip formed of integrally connected preformed terminals toward the apparatus's first station. It includes grasping means that securely hold the leading terminal until it is inserted into the workpiece. Additionally, the machine has shearing means to sever the leading terminal from the supply strip and driving means that operate to insert the terminal into the workpiece.

Career Highlights

H T Meyer is associated with General Staple Company, Inc., where he applies his expertise in automation and innovation. His work has significantly contributed to advancements in manufacturing processes, particularly in the area of terminal insertion.

Collaborations

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Conclusion

H T Meyer’s contributions to the field of automation through his invention of the Autotab machine exemplify the impact of innovative thinking in manufacturing. His work continues to influence the efficiency of production processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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