H Scott Fetterman

Title: H Scott Fetterman: Innovator in Integrated Circuit Testing

Introduction

H Scott Fetterman is a notable inventor based in New Tripoli, PA (US). He has made significant contributions to the field of integrated circuits, particularly in the area of stress migration testing. With a total of 8 patents to his name, Fetterman has developed innovative solutions that enhance the reliability of electronic components.

Latest Patents

Fetterman's latest patents include a stress migration test structure and method designed to detect stress migration defects in traces or conductors of integrated circuits. This test structure can be strategically placed between die areas on a wafer or on a die itself. It can be positioned in otherwise unused areas of a die, such as between bond pads and the periphery, or in layers beneath bond pads. The structure can also be utilized within the standard area for circuit layout, allowing it to function as a stress migration test structure once the die is packaged. Information can be obtained from the impedance segments of this test structure using either mechanical or electrical stepping techniques.

Career Highlights

Throughout his career, Fetterman has worked with prominent companies such as Lucent Technologies Inc. and Agere Systems Inc. His experience in these organizations has contributed to his expertise in integrated circuit technology and innovation.

Collaborations

Fetterman has collaborated with notable individuals in the industry, including David Arthur Rich and Vivian Wanda Ryan. These partnerships have likely fostered a creative environment that has led to advancements in his work.

Conclusion

H Scott Fetterman is a distinguished inventor whose work in integrated circuit testing has made a lasting impact on the field. His innovative patents and collaborations reflect his commitment to enhancing electronic reliability.