St. Louis, MO, United States of America

H Michael Gach

This inventor holds 1 USPTO granted patent. Top assignee: Washington University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: H Michael Gach. Retrieved from https://idiyas.com/inventor/h-michael-gach

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: H Michael Gach: Innovator in MRI Technology

Introduction

H Michael Gach is a notable inventor based in St. Louis, MO (US). He has made significant contributions to the field of medical imaging, particularly in enhancing MRI technology. His work focuses on improving the quality and accuracy of MRI-guided treatment systems.

Latest Patents

H Michael Gach holds a patent for "Systems and methods for real-time B0 fluctuation compensation." This patent describes devices, systems, and methods aimed at enhancing MRI image quality and tracking accuracy in MR-guided treatment systems. He has 1 patent to his name, showcasing his innovative approach to medical technology.

Career Highlights

Gach is affiliated with Washington University, where he continues to advance research in medical imaging. His work has been instrumental in developing technologies that improve patient outcomes in MRI procedures.

Collaborations

Throughout his career, H Michael Gach has collaborated with talented individuals such as Austen Curcuru and Taeho Kim. These partnerships have contributed to the success of his projects and innovations.

Conclusion

H Michael Gach is a prominent figure in the field of MRI technology, with a focus on enhancing imaging quality and accuracy. His contributions through patents and collaborations reflect his commitment to advancing medical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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