This inventor holds 1 USPTO granted patent. Top assignee: Hoesch Werke Aktiengesellschaft. Active years: 1983.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1983
Title: H J Kopineck: Innovator in Surface Flaw Detection Technology
Introduction
H J Kopineck is a notable inventor based in Dortmund, Germany. He has made significant contributions to the field of surface flaw detection in rapidly moving sheet materials. His innovative approach has led to the development of a unique device that enhances quality control in manufacturing processes.
Latest Patents
Kopineck holds a patent for a "Device for detecting surface flaws of rapidly moving sheet material." This device is designed to identify surface imperfections in metal strips as they move through rolling mills. It utilizes a lens to scan the surface of the sheet material, while a camera tube converts the optical images into electrical values. These values are then stored in magnetic storage and can be retrieved for conversion and display on an image reproducing device, providing a visible representation of the scanned surface. The device also incorporates at least one image amplifier or image converter tube, which includes an electronic speed shutter, enhancing its functionality.
Career Highlights
H J Kopineck has worked with Hoesch Werke Aktiengesellschaft, a prominent company in the manufacturing sector. His role at the company has allowed him to apply his innovative ideas and contribute to advancements in technology related to surface flaw detection.
Collaborations
Kopineck has collaborated with Wilhelm Tappe, working together to further develop and refine their technologies in the field of manufacturing and quality control.
Conclusion
H J Kopineck's contributions to the field of surface flaw detection have made a significant impact on manufacturing processes. His innovative device exemplifies the importance of technology in ensuring quality and efficiency in production.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
