White Plains, NY, United States of America

H Eugene Waldenmaier

This inventor holds 2 USPTO granted patents, plus 1 CIPO patent. Top assignees: Hughes Danbury Optical Systems, Inc., Other. Active years: 1992-1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: H Eugene Waldenmaier. Retrieved from https://idiyas.com/inventor/h-eugene-waldenmaier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 1.5

ph-index = 2

Forward Citations = 136(Granted Patents)


Company Filing History:


Years Active: 1992-1998

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2 patents (USPTO):Explore Patents

Title: H Eugene Waldenmaier: Innovator in Optical Surveillance and Metrology

Introduction

H Eugene Waldenmaier is a notable inventor based in White Plains, NY (US). He has made significant contributions to the fields of optical surveillance and metrology, holding a total of 2 patents. His innovative work has paved the way for advancements in traffic surveillance systems and optical measurement techniques.

Latest Patents

Waldenmaier's latest patents include a groundbreaking surveillance system that utilizes a single optical element. This system provides structural support between optical elements, ensures alignment stability, and minimizes central obscuration for a distortion-free, wide field of view. The design allows for a panoramic optical surveillance system with a range of ±80 degrees. Notably, the system features a learn mode that eliminates the need for extensive programming during installation, enabling real-time traffic analysis and reporting from a single video surveillance unit.

Another significant patent is the optical thickness profiler using synthetic wavelengths. This optical metrology method involves generating three optical wavelengths of fixed polarization, which are separated into a reference beam and a measurement beam. The system measures differences in optical path lengths, providing precise measurements of thickness or index of refraction across various surfaces.

Career Highlights

Throughout his career, Waldenmaier has worked with various companies, including Hughes Danbury Optical Systems, Inc. His experience in these organizations has contributed to his expertise in optical technologies and surveillance systems.

Collaborations

Waldenmaier has collaborated with notable individuals such as P J DeGroot and G H Hayes. These partnerships have further enhanced his innovative capabilities and contributions to the field.

Conclusion

H Eugene Waldenmaier's work in optical surveillance and metrology showcases his inventive spirit and dedication to advancing technology. His patents reflect a commitment to improving systems that enhance safety and efficiency in traffic management and optical measurements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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