Sulzburg, Germany

Günter Stiefvater

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Micronas Gmbh. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Günter Stiefvater. Retrieved from https://idiyas.com/inventor/günter-stiefvater

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovations of Günter Stiefvater

Introduction

Günter Stiefvater is a notable inventor based in Sulzburg, Germany. He has made significant contributions to the field of technology, particularly in the area of probe card assemblies. His work has led to advancements that enhance the testing of semiconductor wafers.

Latest Patents

Günter Stiefvater holds a patent for a probe card assembly. This invention relates to a probe card assembly that includes a stiffener, a printed circuit board (PCB) disposed within the stiffener, and a spider supported by both the stiffener and the PCB. The spider comprises at least one probe designed to test a wafer. The unique design of this probe card assembly allows the PCB to be supported in a loosely decoupled manner within the stiffener, effectively preventing the transmission of high thermally-induced warping effects.

Career Highlights

Günter Stiefvater is currently employed at Micronas GmbH, where he continues to innovate and develop new technologies. His expertise in the field has made him a valuable asset to the company and the industry as a whole.

Collaborations

Günter has collaborated with Wolfgang Hauser, further enhancing the innovative capabilities within their projects.

Conclusion

Günter Stiefvater's contributions to the field of technology, particularly through his patent for a probe card assembly, demonstrate his commitment to innovation and excellence. His work continues to impact the semiconductor testing industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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