Kleinsendelbach, Germany

Günter Gieres

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Osram Opto Semiconductors Gmbh. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Günter Gieres. Retrieved from https://idiyas.com/inventor/günter-gieres

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 14.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Günter Gieres: Innovator in Radiation Emitting Devices

Introduction

Günter Gieres is a notable inventor based in Kleinsendelbach, Germany. He has made significant contributions to the field of radiation-emitting devices, showcasing his expertise through his innovative patents.

Latest Patents

Günter Gieres holds a patent for a radiation-emitting device and the method for its production. This invention features a first electrode, a first emission layer, a second emission layer, and a second electrode. The patent also outlines a method for producing this advanced radiation-emitting device, highlighting Gieres' technical proficiency and innovative approach.

Career Highlights

Throughout his career, Gieres has worked with prominent companies in the industry, including Osram Opto Semiconductors GmbH and Osram OLED GmbH. His experience in these organizations has allowed him to develop and refine his skills in the field of optoelectronics.

Collaborations

Günter Gieres has collaborated with notable professionals in his field, including Michael Fehrer and Karsten Heuser. These partnerships have contributed to the advancement of technology in radiation-emitting devices.

Conclusion

Günter Gieres is a distinguished inventor whose work in radiation-emitting devices has made a significant impact in the field. His innovative patent and collaborations with industry professionals underscore his contributions to technology and innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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