Gérald Hamon

Title: Gérald Hamon: Innovator in X-ray Tomography

Introduction

Gérald Hamon is a notable inventor based in Pau, France. He has made significant contributions to the field of X-ray tomography, holding two patents that showcase his innovative approach to imaging technology.

Latest Patents

Hamon's latest patents include an advanced X-ray tomography device designed to provide a 3D image of a sample. This device comprises an X-ray source, a cell, a photon detector, and a processing unit. The processing unit computes the 3D tomography image based on acquired images corresponding to various cell angles. The cell is strategically positioned to ensure that the photon detector primarily senses photons emanating from the sample within the cell. Additionally, the photon detector is overexposed to cancel out pixels corresponding to photons not originating from the sample. Another patent details a similar X-ray tomography device, which also includes a first and second grating with a grating period of less than 200 nm, along with a microscope situated between the second grating and the detector.

Career Highlights

Throughout his career, Gérald Hamon has worked with prominent organizations, including Total SA and the Université de Pau et des Pays de l'Adour. His experience in these institutions has contributed to his expertise in the field of imaging technology.

Collaborations

Hamon has collaborated with notable colleagues such as Patrice Creux and Franz Pfeiffer, further enhancing his work in X-ray tomography.

Conclusion

Gérald Hamon is a distinguished inventor whose work in X-ray tomography has advanced the capabilities of imaging technology. His patents reflect a commitment to innovation and excellence in the field.