Seattle, WA, United States of America

Gyeung H Kim

This inventor holds 1 USPTO granted patent. Top assignee: The Washington Technology Center. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gyeung H Kim. Retrieved from https://idiyas.com/inventor/gyeung-h-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 1994

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Gyeung H Kim: Innovator in Ceramic/Metal Composites

Introduction

Gyeung H Kim is a notable inventor based in Seattle, WA (US). He has made significant contributions to the field of materials science, particularly in the development of ceramic/metal composites. His innovative approach has led to advancements that enhance the performance of these materials.

Latest Patents

Gyeung H Kim holds a patent for a "Method of making ceramic/metal composites with layers of high and low." This invention focuses on creating composites that exhibit high fracture strength and toughness. The process involves arranging layers of ceramic with unequal concentrations and porosity, allowing for full infiltration by metal.

Career Highlights

Gyeung H Kim is associated with the Washington Technology Center, where he has been instrumental in research and development. His work has paved the way for new applications of ceramic/metal composites in various industries.

Collaborations

Gyeung has collaborated with esteemed colleagues such as Mehrdad Yasrebi and Mehmet Sarikaya. Their combined expertise has contributed to the advancement of innovative materials and technologies.

Conclusion

Gyeung H Kim's contributions to the field of ceramic/metal composites demonstrate his commitment to innovation and excellence. His work continues to influence the development of advanced materials that meet the demands of modern applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…