Gwangyeong Stanley Jeong

Title: Gwangyeong Stanley Jeong: Memory Device Testing Innovation.

Introduction

Gwangyeong Stanley Jeong is an inventor based in San Jose, California. His patent work focuses on memory-device testing and identifying differences in data across memory banks. He is associated with SK hynix Inc.

Latest Patents

Jeong is credited with 1 patent: “Memory Device and Test Method Thereof.” The invention describes a test method in which multiple memory banks operate in the same manner. The method activates rows corresponding to a row address, latches the bank and row addresses, and writes the same data to columns selected by a column address. It then reads and compares the data across the banks. If the data differ, the bank and row addresses are programmed into nonvolatile memory.

Career Highlights

Jeong’s listed patent highlights his work on memory-device testing, particularly a process for detecting and recording discrepancies among memory banks. His professional association is with SK hynix Inc.

Collaborations

Jeong’s listed coworkers include Hyunsu Yoon and Youncheul Kim.

Conclusion

Gwangyeong Stanley Jeong’s patent documents a memory-testing approach that compares data across banks and preserves address information when discrepancies are found.