Daejeon, South Korea

Gwang Mok Kim

This inventor holds 1 USPTO granted patent. Top assignee: Korea Institute of Geoscience and Mineral Resources. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Gwang Mok Kim. Retrieved from https://idiyas.com/inventor/gwang-mok-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Gwang Mok Kim: Innovator in Raman Analysis Technology

Introduction

Gwang Mok Kim is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of material analysis through his innovative inventions. His work focuses on developing advanced technologies that enhance the capabilities of scientific analysis.

Latest Patents

One of Gwang Mok Kim's notable patents is a Raman analysis apparatus capable of real-time analysis under elevated temperature and pressure conditions. This invention allows for real-time Raman analysis while conducting experiments on various samples, including powder solids, single crystals, and high-concentration liquids. The technology is particularly useful in surface or material property analysis, providing researchers with valuable insights.

Career Highlights

Gwang Mok Kim is affiliated with the Korea Institute of Geoscience and Mineral Resources, where he continues to advance research in geoscience and mineral resources. His expertise in Raman analysis technology has positioned him as a key figure in his field.

Collaborations

Gwang Mok Kim has collaborated with notable colleagues, including Seungwoo Lee and Jong Hwan Oh. Their combined efforts contribute to the ongoing development of innovative technologies in material analysis.

Conclusion

Gwang Mok Kim's contributions to Raman analysis technology exemplify the importance of innovation in scientific research. His work not only enhances analytical capabilities but also paves the way for future advancements in material science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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