Company Filing History:
Years Active: 2023-2025
Title: The Innovations of Guy Shwartz
Introduction
Guy Shwartz is a prominent inventor based in Ramat Gan, Israel. He has made significant contributions to the field of microscopy and metrology, holding a total of 4 patents. His work focuses on developing advanced systems for non-destructive analysis of specimens.
Latest Patents
One of his latest patents is titled "Scanning electron microscopy-based tomography of specimens." This invention discloses a system that includes a scanning electron microscope (SEM) and processors designed for non-destructive tomography. The SEM captures a sinogram of a tested specimen by projecting e-beams at various angles and measuring the intensity of returned electrons. The processors then create a tomographic map by determining values indicative of the specimen's components.
Another notable patent is "Hybrid scanning electron microscopy and acousto-optic based metrology." This method combines acousto-optic and scanning electron microscopy to obtain measurement data from an inspected structure. The process involves extracting key measurement parameters and using an algorithm to estimate structural parameters of the inspected structure.
Career Highlights
Guy Shwartz is currently employed at Applied Materials Israel Limited, where he continues to innovate in the field of microscopy and metrology. His work has significantly advanced the capabilities of non-destructive testing methods.
Collaborations
He collaborates with talented coworkers, including Ido Almog and Ori Golani, who contribute to his innovative projects and research.
Conclusion
Guy Shwartz's contributions to the field of microscopy and metrology are noteworthy, as he continues to push the boundaries of non-destructive analysis. His patents reflect a commitment to advancing technology and improving measurement techniques.