Shanghai, China

Guoxing Shi

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Shanghai Teroako Electronic Co., Ltd., Teraoka Seiko Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guoxing Shi. Retrieved from https://idiyas.com/inventor/guoxing-shi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Guoxing Shi: Innovator in Load Cell Technology

Introduction

Guoxing Shi is a notable inventor based in Shanghai, China. He has made significant contributions to the field of load cell technology, particularly with his innovative designs that enhance weighing systems. His work is characterized by a focus on safety and efficiency in weighing applications.

Latest Patents

Guoxing Shi holds a patent for a "Load cell scale for weighing with overload protection." This invention features a columnar shaped load cell part that includes a first and second load cell for different weight measurements. The design incorporates a stopper part that restricts deformation in the load cell, ensuring accurate readings even under overload conditions. The load cell part is designed to elastically deform, with a stopper portion that effectively manages the load applied, enhancing the reliability of the weighing system.

Career Highlights

Throughout his career, Guoxing Shi has worked with several prominent companies. He has been associated with Teraoka Seiko Co., Ltd. and Shanghai Teraoka Electronic Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electronic weighing technologies.

Collaborations

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Conclusion

Guoxing Shi's innovative work in load cell technology exemplifies his commitment to improving weighing systems. His patent reflects a deep understanding of the challenges in the field and offers practical solutions that enhance safety and accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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