Nanjing, China

Guoxing Du

This inventor holds 1 USPTO granted patent. Top assignee: Forintek Canada Corporation. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guoxing Du. Retrieved from https://idiyas.com/inventor/guoxing-du

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2004

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Guoxing Du: Innovator in Humidity Measurement Technology

Introduction

Guoxing Du is a notable inventor based in Nanjing, China. He has made significant contributions to the field of humidity measurement, particularly in high-temperature environments. His innovative approach has led to the development of a unique patent that addresses a critical need in various industries.

Latest Patents

Guoxing Du holds a patent titled "Method for determining the relative humidity of a volume of air having a temperature of 100° C or greater." This invention is particularly valuable for applications where accurate humidity measurement is essential, especially in high-temperature settings.

Career Highlights

Guoxing Du is currently employed at Forintek Canada Corporation, where he continues to work on advancements in measurement technologies. His expertise in humidity measurement has positioned him as a key figure in his field.

Collaborations

Guoxing Du collaborates with Chunping Dai, who is also involved in innovative projects related to measurement technologies. Their partnership enhances the research and development efforts at Forintek Canada Corporation.

Conclusion

Guoxing Du's contributions to humidity measurement technology demonstrate his commitment to innovation and excellence. His work continues to impact various industries, making him a significant figure in the field of invention.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…