Longyan, China

Guowei Zeng

This inventor holds 1 USPTO granted patent. Top assignee: Tpk Touch Solutions (Xiamen) Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guowei Zeng. Retrieved from https://idiyas.com/inventor/guowei-zeng-j9j7tzev

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Guowei Zeng and His Patent for an Invisible-Electrode Substrate

Introduction

Guowei Zeng is an inventor associated with Longyan, China. His work includes a patent for a substrate structure designed to make inner electrode patterns invisible.

Latest Patents

Zeng is credited with 1 patent: “Substrate Structure and Fabrication Method Thereof.” The invention describes a substrate with an electrode pattern, a three-layer laminated structure, and a passivation layer. The layers are arranged so that their refractive indexes decrease sequentially from the electrode pattern through the laminated layers to the passivation layer. This optical arrangement is intended to conceal the inner electrode patterns.

Career Highlights

Zeng is associated with TPK Touch Solutions (Xiamen) Inc. His patent focuses on substrate construction and fabrication, with a design intended to improve the appearance of structures containing electrode patterns.

Collaborations

The provided information identifies Ting-Hsiang Lee and Kuo-Shu Hsu as Zeng’s coworkers. It does not specify whether they collaborated with him on this patent.

Conclusion

Guowei Zeng’s patent presents a layered substrate design that uses sequential refractive-index changes to make inner electrode patterns less visible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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