Campbell, CA, United States of America

Guorong Vera Zhuang


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 35(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Guorong Vera Zhuang: Innovator in Polarimetry Technology

Introduction

Guorong Vera Zhuang is a notable inventor based in Campbell, California. He has made significant contributions to the field of polarimetry, particularly in the characterization of complex grating structures. His innovative approach combines different spectroscopic techniques to enhance measurement accuracy.

Latest Patents

Zhuang holds a patent titled "Combination of normal and oblique incidence polarimetry for the characterization of gratings." This invention integrates a normal incidence spectroscopic polarimeter with an oblique incidence spectroscopic polarimeter. The combination allows for precise characterization of complex grating structures, including those with sloping sidewalls, notches, and multiple underlying layers. The design utilizes a polarizing element positioned in the path of the normal incidence light beam, ensuring that the light is transmitted through the polarizing element before and after interacting with the sample. This innovative system can share a single light source and/or spectrophotometer, enhancing efficiency.

Career Highlights

Zhuang is currently employed at Nanometrics Inc., where he continues to develop advanced measurement technologies. His work has been instrumental in pushing the boundaries of what is possible in the field of optical measurements.

Collaborations

Throughout his career, Zhuang has collaborated with esteemed colleagues, including Pablo I Rovira and John D Heaton. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Guorong Vera Zhuang's contributions to polarimetry technology exemplify the spirit of innovation. His patent and ongoing work at Nanometrics Inc. highlight his commitment to advancing measurement techniques in complex optical systems.

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