Guilin, China

Guokun Zhu

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guokun Zhu. Retrieved from https://idiyas.com/inventor/guokun-zhu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,513 
Other
 patents

Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Guokun Zhu: Innovator in Deflection Scanning Technology

Introduction

Guokun Zhu is a notable inventor based in Guilin, China. He has made significant contributions to the field of deflection scanning technology. His innovative work focuses on enhancing the accuracy and efficiency of scanning systems.

Latest Patents

Guokun Zhu holds a patent for a "Deflection scanning device with multi-phase winding and deflection scanning system." This invention relates to a deflection scanning device characterized by an axisymmetric structure. It includes a ferromagnetic frame and a deflection scanning winding, which is designed to improve the uniformity of magnetic induction intensity in charged particle beam channels. This advancement helps reduce the defocusing effect and enhances scanning accuracy. He has 1 patent to his name.

Career Highlights

Throughout his career, Guokun Zhu has demonstrated a commitment to innovation in his field. His work has been instrumental in developing technologies that improve scanning systems, making them more reliable and efficient.

Collaborations

Guokun Zhu has collaborated with notable colleagues, including Xiaodong Huang and Shouqi Wei. These partnerships have contributed to the advancement of technology in their respective fields.

Conclusion

Guokun Zhu's contributions to deflection scanning technology highlight his role as an influential inventor. His innovative patent reflects his dedication to improving scanning systems and advancing technological capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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